Mixed-signal LSI relationship among measurement accuracy, yield, and test time

Abstract

As the degree of LSI integration is becoming rapidly greater and circuit size is becoming bigger, the bigger LSI test cost due to longer test time in LSI production becomes more serious. This paper discusses how much impact mixed LSI measurement accuracy improvement affects test time and LSI yield by analyzing the test results in a production test. It is a practical and effective example for the semiconductor industry to show the relationship among measurement accuracy, test time, and yield based on the actual test data.