Correlation of Analytical Facilities

Benjamin A. Moore
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引用次数: 0

Abstract

New and emerging technologies such as VHSIC/VLSI and the expanded use of hybrids have presented a new series of problems in correlating analytical laboratory mass spectrometric moisture measurements. Standards and techniques, designed and tested for application in the more benign environment of smaller scale monolithic packaging, may not be directly applicable to new adsorption/desorption conditions and relatively large ( ¿lcc) sample gas volumes. The development of moisture standards is traced from the original Method 1018.2 (Internal Water Vapor Content) analytical laboratory certification program to the present. The results of several correlation experiments are presented, and the effect of time-temperature stress upon the stability of past and present standards is discussed. Design criteria for new standards is developed in order to solve both inherent sample problems and the challenge of tomorrow's technologies. Current efforts in this area are summarized. Semiconductor product moisture analysis data not only supports previously determined laboratory correlations but also positively establishes the success of Method 1018.2 in reducing the potential inclusion of moisture reliability hazards in military systems.
分析设备的相关性
新的和新兴的技术,如VHSIC/VLSI和混合使用的扩大提出了一系列新的问题,相关的分析实验室质谱水分测量。设计和测试的标准和技术适用于较小规模的单片封装的更良性的环境,可能不能直接适用于新的吸附/解吸条件和相对较大(¿lcc)的样品气体体积。水分标准的发展可以追溯到最初的方法1018.2(内部水蒸气含量)分析实验室认证程序到现在。给出了几个相关试验的结果,并讨论了时温应力对过去和现在标准稳定性的影响。新标准的设计标准是为了解决固有的样品问题和未来技术的挑战而开发的。总结了目前在这一领域的努力。半导体产品水分分析数据不仅支持先前确定的实验室相关性,而且还积极地建立了方法1018.2在减少军事系统中潜在的水分可靠性危害方面的成功。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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