40 to 85GHz power amplifier MMICs using an optical lithography based low cost GaAs PHEMT process

K. Fujii, J. Stanback, H. Morkner
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引用次数: 4

Abstract

An optical photo lithography based 0.15µm GaAs PHEMT process and 2mil-substrate technology that enables high production throughput and low cost is described. The developed process achieved Imax=575mA/mm, BVgd=14V, and 753mW/mm of output power density at P-1 condition at 18GHz. Design and test results for balanced and single-ended power amplifiers (PA) for 40 to 85GHz applications are described as process capability verification. Balanced PA MMICs shows 18dB of small-signal gain and 17dBm of output power up to 85GHz frequencies. MMIC test results verified the process capability to manufacture MMIC devices for applications up to 90GHz.
40至85GHz功率放大器mmic采用基于光学光刻的低成本GaAs PHEMT工艺
介绍了一种基于0.15 μ m GaAs PHEMT工艺和2mil衬底技术的光学光刻技术,该技术可实现高产量和低成本。所开发的工艺在18GHz的P-1条件下实现了输出功率密度Imax=575mA/mm, BVgd=14V, 753mW/mm。用于40至85GHz应用的平衡式和单端功率放大器(PA)的设计和测试结果被描述为过程能力验证。平衡PA mmic在85GHz频率下的小信号增益为18dB,输出功率为17dBm。MMIC测试结果验证了制造高达90GHz应用的MMIC器件的工艺能力。
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