High power GaN-HEMT microwave switches for X-Band and wideband applications

A. Bettidi, A. Cetronio, M. De Dominicis, G. Giolo, C. Lanzieri, A. Manna, M. Peroni, C. Proietti, P. Romanini
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引用次数: 21

Abstract

In this article the design, fabrication and test of X-band and 2-18 GHz wideband high power SPDT MMIC switches in GaN technology are presented. Said switches have demonstrated state-of-the-art performance and RF fabrication yields better than 65%. In particular the X-band switch exhibits an on-state power handling capability of better than 37 dBm at the 1 dB insertion loss compression point and the wideband switch shows an insertion loss compression of 1 dB for input power higher than 34.3 dBm in the entire bandwidth.
用于x波段和宽带应用的高功率GaN-HEMT微波开关
本文介绍了基于GaN技术的x波段和2-18 GHz宽带大功率SPDT MMIC开关的设计、制造和测试。所述开关已展示出最先进的性能,射频制造收率优于65%。特别是,x波段开关在1db插入损耗压缩点显示出优于37dbm的导通功率处理能力,而宽带开关在整个带宽内输入功率高于34.3 dBm时显示出1db的插入损耗压缩能力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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