Bulk-based DC offset calibration for low-power memristor array read-out system

C. Mohan, L. Camuñas-Mesa, E. Vianello, L. Perniola, C. Reita, J. M. de la Rosa, T. Serrano-Gotarredona, B. Linares-Barranco
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Abstract

Memristors in neuromorphic circuits typically need to drive currents of many mA because their Low Resistance State (LRS) is in the order of a few kΩ and many devices need to be activated simultaneously which results in high power consumptions. Reducing read-out pulses amplitudes below the typical 0.1V is not trivial, as offset voltages of read-out circuits start to affect the results. This paper presents a three-stage cascaded calibration to compensate for the resting offset voltage of crossbar lines generated in the amplifiers driving memristive devices in memristor array read-out systems. The proposed calibration technique is based on adjusting the bulk voltage of the input differential pairs by means of a switchable cascade of resistor ladders. As a result, the calibrated offset voltage can be further reduced with the number of stages in the cascade, leading to a calibration voltage step below 0.1mV — only limited in practice by mismatch and electrical noise. The circuit has been designed in 130nm CMOS technology, and its operation has been verified with oxide-based resistive memory (OxRAM) devices operated in binary mode to implement synapses in neuro-morphic circuits. Layout-extracted simulations considering PVT variations are considered to validate the presented calibration technique.
小功率忆阻阵列读出系统的大体积直流偏置校正
神经形态电路中的忆阻器通常需要驱动许多mA的电流,因为它们的低电阻状态(LRS)在几个kΩ的数量级,并且需要同时激活许多器件,这导致高功耗。将读出脉冲幅度降低到典型的0.1V以下并非易事,因为读出电路的失调电压开始影响结果。本文提出了一种三级级联校准方法,用于补偿忆阻阵列读出系统中驱动忆阻器件的放大器产生的横杆线的静息偏置电压。所提出的校准技术是基于通过一个可切换的电阻梯级联来调整输入差分对的总体电压。因此,校准偏置电压可以随着级联级数的增加而进一步降低,从而使校准电压阶跃低于0.1mV,仅在实践中受到失配和电气噪声的限制。该电路采用130nm CMOS技术设计,并在二进制模式下使用基于氧化物的电阻存储器(OxRAM)器件来实现神经形态电路中的突触,验证了其工作原理。考虑PVT变化的布图提取仿真验证了所提出的标定技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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