POL DC-DC Converter Output Capacitor Bank’s Reliability Comparison using Prediction Standard MIL-HDBK-217F and SN 29500

Dan Butnicu
{"title":"POL DC-DC Converter Output Capacitor Bank’s Reliability Comparison using Prediction Standard MIL-HDBK-217F and SN 29500","authors":"Dan Butnicu","doi":"10.1109/SIITME53254.2021.9663431","DOIUrl":null,"url":null,"abstract":"A higher level of reliability became a compulsory demand in modern DC-DC converters [4]. Since the latest version MIL-HDBK-217F Notice 2 released in 1995 [1], newer failure rate prediction standards had appeared on the electronic systems reliability market. These are introduced to compensate for the lack of the newest component technology in the above-mentioned standard. When it comes to reliability many studies have shown that the output capacitor bank is demonstrated to be the most critical component [3]. In this work, the failure rate of an output capacitor bank used within a high current low voltage buck converter is calculated both by the latest prediction standard SN 29500 and by with the previous standard MIL-HDBK, providing a comparison between the two which is a helpful tool for the output capacitor selection in the early stage design. The components’ environmental conditions were defined by a standard POL buck converter used for both calculation methodologies. Results are compared by taking account of the influence of the component’s temperature and application of specific parameters such as temperature cycles.","PeriodicalId":426485,"journal":{"name":"2021 IEEE 27th International Symposium for Design and Technology in Electronic Packaging (SIITME)","volume":"79 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 27th International Symposium for Design and Technology in Electronic Packaging (SIITME)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SIITME53254.2021.9663431","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

A higher level of reliability became a compulsory demand in modern DC-DC converters [4]. Since the latest version MIL-HDBK-217F Notice 2 released in 1995 [1], newer failure rate prediction standards had appeared on the electronic systems reliability market. These are introduced to compensate for the lack of the newest component technology in the above-mentioned standard. When it comes to reliability many studies have shown that the output capacitor bank is demonstrated to be the most critical component [3]. In this work, the failure rate of an output capacitor bank used within a high current low voltage buck converter is calculated both by the latest prediction standard SN 29500 and by with the previous standard MIL-HDBK, providing a comparison between the two which is a helpful tool for the output capacitor selection in the early stage design. The components’ environmental conditions were defined by a standard POL buck converter used for both calculation methodologies. Results are compared by taking account of the influence of the component’s temperature and application of specific parameters such as temperature cycles.
基于预测标准MIL-HDBK-217F和SN 29500的POL DC-DC变换器输出电容组可靠性比较
更高水平的可靠性成为现代DC-DC变换器的强制性要求。自1995年发布最新版本MIL-HDBK-217F通知2以来,电子系统可靠性市场上出现了新的故障率预测标准。这些是为了弥补上述标准中最新组件技术的不足而引入的。当涉及到可靠性,许多研究表明,输出电容器组被证明是最关键的组件[3]。本文采用最新的预测标准SN 29500和之前的标准MIL-HDBK计算了大电流低压降压变换器中使用的输出电容组的故障率,并对两者进行了比较,为早期设计中输出电容的选择提供了有用的工具。组件的环境条件由用于两种计算方法的标准POL降压转换器定义。通过考虑组件温度的影响和特定参数(如温度循环)的应用,对结果进行比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信