Detection of PLA multiple crosspoint faults

Abstract

An original approach to fault simulation of crosspoint faults in PLAs that goes beyond the normal assumption of single defects is presented: such a method, using concepts derived from critical path backtracing, makes use of the minimum set of information needed for exact, complete analysis without treating each fault individually. Experimental results are also presented to show the importance of multiple faults in common PLAs as well as to discuss the simulator performance.<>