Back contact band offset study of Mo-CZTS based solar cell structure by using XPS/UPS techniques

T. Dhakal, S. Harvey, M. Van Hest, G. Teeter
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引用次数: 9

Abstract

The back contact issues of Cu2ZnSnS4 (CZTS) solar cells are rarely studied. The conventional back contact layers used for CZTS are molybdenum (Mo) and moly-disulfide (MoS2). In this paper, the band offset at the Mo/MoS2 interface is reported. The Mo/MoS2 interface was formed by annealing Mo foil in a sulfur rich ambient. XPS/UPS spectra were then obtained without exposing the sample to ambient atmosphere. The valence band maxima (VBM) and the core level binding energies were obtained to estimate the band alignment. Our results showed that a Schottky junction was formed at the Mo/MoS2 interface with a barrier height of 0.36eV. The valence band maximum at the interface was 0.84eV and the corresponding band bending was 0.11 eV at the interface. A band diagram of the Mo/MoS2 interface created with these values showed that the formation of MoS2 between Mo and CZTS layer would not be a barrier to the holes at least at the Mo-side of the Mo/MoS2/CZTS interface.
利用XPS/UPS技术研究Mo-CZTS基太阳能电池结构的背接触带偏移
Cu2ZnSnS4 (CZTS)太阳能电池的背接触问题研究较少。用于CZTS的传统背接触层是钼(Mo)和二硫化钼(MoS2)。本文报道了Mo/MoS2界面处的带偏。通过在富硫环境中对Mo箔进行退火,形成Mo/MoS2界面。然后在不将样品暴露于环境大气的情况下获得XPS/UPS光谱。用价带最大值(VBM)和核能级结合能来估计带的排列。结果表明,在Mo/MoS2界面处形成了一个势垒高度为0.36eV的肖特基结。界面处的价带最大值为0.84eV,相应的带弯曲为0.11 eV。用这些值生成的Mo/MoS2界面带图表明,Mo和CZTS层之间形成的MoS2不会阻挡Mo/MoS2/CZTS界面的Mo侧的空穴。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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