The Effect of Mixed Gas Ar+H2 Strip Plasma onto the Non-Roughened and Oxidation-Roughened Bare Cu Leadframe Surfaces

Marty Lorgino D. Pulutan, Matthew M. Fernandez, Janice Estolano
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Abstract

High power applications have driven the package assembly to design devices into more robust packaging at lower manufacturing cost that could survive stringent reliability tests with no consequent failures such as delamination. For molded packages, the industry slowly shift to non-plated bare Cu leadframes for higher mold adhesion as the organic compound has higher affinity to Cu surfaces. However, the risk of oxide formation on top surface is deemed detrimental especially when exposed to series of heat processes along with material staging time in an uncontrolled environment. Plasma treatment prior mold has been introduced as dry method for isotropic and homogenous cleaning of surface impurities on metal surfaces. Different plasma chemistries are being utilized for different applications on device packaging with varying surface alteration effect. Plasma cleaning has two different mechanisms-through physical sputtering and through chemical reaction. Pure Ar plasma are widely used for surface activation and has prominent sputtering effect which causes micro to submicron surface roughening. However, material redeposition of etched particles from the topmost layer are commonly encountered which causes performance failure such as leakage current. The pure Ar plasma composition could not also completely remove the unwanted oxide layers since inert Ar ion species are highly unreactive and thus has a less effective surface cleaning. On the other hand, the mixed gas plasma chemistry with a certain percent amount of Hydrogen introduces minimal to no surface alteration as the primary reactive Hydrogen radicals react with organic layers producing volatile hydrides byproduct during chemical reaction with oxides thus cleaning the surface and exposing the base metal [1]. The study focused on surface characterization of non-roughened and oxidation-roughened bare Cu leadframes in response of 95:5 $\text{Ar}+\mathrm{H}2$ strip plasma to assess the effectiveness and define optimized parameters for efficient oxide surface cleaning of mixed gas plasma chemistry in response to 0-hour and post reliability mold-to-Cu surface interface delamination and test performance.
混合气体Ar+H2带等离子体对未粗化和氧化粗化裸铜引线框架表面的影响
高功率应用推动封装组装以更低的制造成本将器件设计成更坚固的封装,可以通过严格的可靠性测试,而不会出现分层等后续故障。对于模压封装,由于有机化合物对铜表面具有更高的亲和力,因此行业逐渐转向非电镀裸铜引线框架,以获得更高的模具附着力。然而,在顶表面形成氧化物的风险被认为是有害的,特别是当暴露于一系列的加热过程以及材料在不受控制的环境中的分期时间时。介绍了一种采用等离子体预处理模具的干燥方法对金属表面杂质进行各向同性、均匀的清洗。不同的等离子体化学被用于不同的器件封装,具有不同的表面改变效应。等离子体清洗有两种不同的机制——物理溅射和化学反应。纯氩等离子体广泛用于表面活化,具有显著的溅射效应,可使表面粗化到微到亚微米。然而,最上层蚀刻颗粒的材料再沉积通常会导致漏电流等性能失效。纯氩等离子体成分也不能完全去除不需要的氧化层,因为惰性氩离子是高度不反应的,因此表面清洁效果较差。另一方面,在混合气体等离子体化学中加入一定比例的氢,由于主要的活性氢自由基与有机层发生反应,在与氧化物的化学反应中产生挥发性氢化物副产物,从而清洁了表面,暴露了贱金属[1]。研究重点是在95:5 $\text{Ar}+\ mathm {H}2$条形等离子体条件下,未粗化和氧化粗化裸Cu铅框的表面表征,以评估混合气体等离子体化学的有效性,并确定优化参数,以响应0小时和可靠性后模具-Cu表面界面分层和测试性能。
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