Copper-related defects in ZnTe thin films grown by the close space sublimation method

I. Lungu, L. Ghimpu, Dumitru Untila, T. Potlog
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引用次数: 0

Abstract

Low-temperature photoluminescence (PL) is used to study defects evolution via immersion technique and annealing in vacuum of ZnTe thin films. In this paper we studied how copper doping from solutions of different molar concentrations affects PL of ZnTe thin films grown by close space sublimation (CSS) method. Undoped ZnTe thin films showed PL emission in the (520-680) nm wavelength region. The incorporation of copper in ZnTe produce a number of broad emission bands that correspond to an electron transition from the conduction band to spin-orbit states of the localized level of Cu2+ ions. All the studied samples had variable concentrations of oxygen and the possibility of the formation of auxiliary oxides is discussed.
近空间升华法生长ZnTe薄膜中的铜相关缺陷
采用低温光致发光(PL)技术,通过浸没技术和真空退火技术研究了ZnTe薄膜的缺陷演变。本文研究了不同摩尔浓度溶液中掺杂铜对近空间升华法制备ZnTe薄膜PL的影响。未掺杂的ZnTe薄膜在(520 ~ 680)nm波段有发光。铜在ZnTe中的掺入产生了许多宽的发射带,这些发射带对应于Cu2+离子局域水平的从导带到自旋轨道状态的电子跃迁。所有的研究样品都有不同浓度的氧,并讨论了辅助氧化物形成的可能性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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