Measurement corrections for phase noise characterization with different baseband analyzer

Abstract

Phase noise characterization with different instrument required different measurement corrections. In this paper, with frequency discriminator method, two types of spectrum analyzer, e.g. swept signal analyzer and Fast Fourier Transform (FFT) analyzer are used. By looking into the different of operation for the instrument, different sets of correction factor are determined. Considering the correction factor into the phase noise characterization, the measurement results are compared. With a signal source analyzer, the measurement corrections are further verified. A correction measurement with corrections for compensating the instrument effect in phase noise characterization is discussed.