Connection error location and correction in combinational circuits

Abstract

We present new diagnostic algorithms for localizing connection errors in combinational circuits. Three types of errors are considered: extra, missing, and bad connection errors. Special test patterns are generated to rapidly locate the error. The algorithms are integrated within the Prevail/sup TM/ system. Results on benchmarks show that the error is always located within a time proportional to the product of the circuit size, and the number of used patterns.