High performance BiCMOS technology design for sub-10 ns 4 Mbit BiCMOS SRAM with 3.3 V operation

T. Maeda, H. Gojohbori, K. Inoue, K. Ishimaru, A. Suzuki, H. Kato, M. Kakumu
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引用次数: 5

Abstract

A high-performance 0.5- mu m BiCMOS technology for 4-Mb BiCMOS SRAM for low-voltage operation is discussed. 1.5* performance improvement and low power relative to 0.8- mu m BiCMOS technology are achieved with reduced operation of 3.3 V. In particular, although power-supply voltage is reduced, none of device performance is so severe as to constrain the feasibility of a 0.5- mu m and below BiCMOS technology even for a high-density 4-Mb SRAM. A 16-b 4-Mb BiCMOS SRAM was fabricated to prove the developed 0.5- mu m BiCMOS technology combined with a quadruple poly Si and double Al process. The cell size is 3.5 mu m*5.7 mu m, and the chip size is 8.7mm*18.8 mm. Parametric testing of the 4-Mb BiCMOS SRAM confirmed the expected 9-ns access time at 3.3-V operation. Moreover, the total power dissipation can be managed below 500 mW, which is available for plastic packaging.<>
高性能BiCMOS技术设计,用于低于10 ns的4 Mbit BiCMOS SRAM, 3.3 V工作
讨论了一种用于低压工作的4mb BiCMOS SRAM的高性能0.5 μ m BiCMOS技术。与0.8 μ m BiCMOS技术相比,在降低3.3 V电压的情况下实现了1.5*的性能提升和低功耗。特别是,虽然电源电压降低了,但器件性能没有严重到限制0.5 μ m及以下BiCMOS技术的可行性,即使是高密度的4mb SRAM。为了验证所开发的0.5 μ m BiCMOS技术与四重多晶硅和双铝工艺的结合,制作了一个16-b 4mb的BiCMOS SRAM。电池尺寸为3.5 μ m*5.7 μ m,芯片尺寸为8.7mm*18.8 mm。4mb BiCMOS SRAM的参数测试证实了在3.3 v工作时预期的9 ns访问时间。此外,总功耗可控制在500 mW以下,可用于塑料包装。
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