A high-performance full swing 1-bit hybrid full adder cell

IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Shahbaz Hussain, Mehedi Hasan, Gazal Agrawal, Mohd Hasan
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引用次数: 15

Abstract

This study proposes an 18-transistor full adder (FA) cell based on the full swing hybrid logic style. It has a first stage comprising the XOR-XNOR module followed by pass transistors and inverters to generate the sum and carry outputs. The performance evaluation of the proposed FA cell has been carried out using an HSPICE simulator at the 16 nm process node by comparing it with eight existing FAs over the supply voltage ranging from 0.4 to 1.0 V. The proposed adder achieved 34.77% improvement in propagation delay, 48.8% improvement in average power and 66.58% improvement in Power Delay Product compared to the conventional CMOS Mirror adder while operating at 0.8 V. Moreover, its performance metrics are also better than those of other latest existing adder cells. Hence, the proposed FA is suitable for modern high performance digital processors.

Abstract Image

高性能全摆位1位混合全加法器单元
本研究提出一种基于全摆幅混合逻辑的18晶体管全加法器单元。它有一个第一级,包括异或异或模块,然后是通过晶体管和逆变器来产生和和进位输出。利用HSPICE模拟器在16 nm工艺节点上对所提出的FA电池进行了性能评估,并将其与现有的8个FA电池在0.4至1.0 V的电源电压范围内进行了比较。在工作电压为0.8 V时,与传统CMOS镜像加法器相比,该加法器的传输延迟提高34.77%,平均功率提高48.8%,功率延迟积提高66.58%。此外,它的性能指标也优于其他最新的现有加法器单元。因此,所提出的FA适用于现代高性能数字处理器。
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来源期刊
Iet Circuits Devices & Systems
Iet Circuits Devices & Systems 工程技术-工程:电子与电气
CiteScore
3.80
自引率
7.70%
发文量
32
审稿时长
3 months
期刊介绍: IET Circuits, Devices & Systems covers the following topics: Circuit theory and design, circuit analysis and simulation, computer aided design Filters (analogue and switched capacitor) Circuit implementations, cells and architectures for integration including VLSI Testability, fault tolerant design, minimisation of circuits and CAD for VLSI Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs Device and process characterisation, device parameter extraction schemes Mathematics of circuits and systems theory Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers
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