Optical Evidence of Charge Accumulation in Double Barrier Diodes

N. Vodjdani, E. Costard, F. Chevoir, D. Thomas, P. Bois, S. Delaitre
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Abstract

Tunneling is one of the basic quantum mechanical phenomena which plays a key role in many ultra thin semiconductor devices. Besides their potential for applications, double barrier hetero­structures are also interesting for the understanding of tunneling-based transport processes (1) and their dynamics. Time-resolved photoluminescence (PL) has been used to determine the tunneling escape rate of electrons from a single quantum well through a thin barrier into a continuum (2) and to determine the electric field dependance of this tunneling rate (3).The charge accumulation in the quantum well can be estimated using magnetotunneling (4) or as recently demonstrated steady-state photoluminescence (5).
双势垒二极管中电荷积累的光学证据
隧道效应是一种基本的量子力学现象,在许多超薄半导体器件中起着关键作用。除了潜在的应用之外,双势垒异质结构对于理解基于隧道的输运过程(1)及其动力学也很有趣。时间分辨光致发光(PL)已被用于确定电子从单个量子阱穿过薄势垒进入连续体的隧穿逃逸速率(2),并确定该隧穿速率与电场的依赖关系(3)。量子阱中的电荷积累可以使用磁隧穿(4)或最近证明的稳态光致发光(5)来估计。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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