{"title":"Superconducting Electronics: A New Frontier for Failure Analysis and Reliability","authors":"N. Missert","doi":"10.31399/asm.edfa.2019-2.p054","DOIUrl":null,"url":null,"abstract":"\n This column assesses the current state and outlook for superconducting device technology and its application in exascale computing.","PeriodicalId":431761,"journal":{"name":"EDFA Technical Articles","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"EDFA Technical Articles","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.edfa.2019-2.p054","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This column assesses the current state and outlook for superconducting device technology and its application in exascale computing.