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A numerical tool for the analysis of the effects of conductor losses on interconnect structures

Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects Pub Date : 2002-05-12 DOI:10.1109/SPI.2002.258293
A. Maffucci, G. Miano, G. Rubinacci, F. Villone
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用于分析导体损耗对互连结构影响的数值工具
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Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects
Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects
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