D-mode pHEMT 0.5 um Process Characterization to Wide-Band LNA Design

D. Sotskov, N. Usachev, V. Elesin, A. G. Kuznetsov, K. Amburkin, G. Chukov, M. I. Titova, N. M. Zidkov
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引用次数: 3

Abstract

Results of domestic D-mode pHEMT 0.5 µm process characterization obtained during the design and testing of the single power supply wide-band low noise amplifier (LNA) are present. The simulation and test results demonstrate that designed cascode LNA has operating frequency range up to 3.5 GHz, power gain above 15 dB, noise figure below 2.2 dB, output linearity above than 17 dBm and power consumption less than 325 mW. Potential immunity of LNA to total ionizing dose and destructive single event effects exceed 300 krad and 60 MeV·cm2/mg respectively.
宽带LNA设计的d模pHEMT 0.5 um工艺表征
本文介绍了在单电源宽带低噪声放大器(LNA)设计和测试过程中获得的国产d模pHEMT 0.5µm工艺表征结果。仿真和测试结果表明,所设计的级联LNA工作频率范围可达3.5 GHz,功率增益大于15 dB,噪声系数小于2.2 dB,输出线性度大于17 dBm,功耗小于325 mW。LNA对总电离剂量和破坏性单事件效应的潜在免疫分别超过300 krad和60 MeV·cm2/mg。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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