A methodology for fault model development for hierarchical linear systems

Yin-Chao Huang, Chung-Len Lee, Jun-Weir Lin, Jwu-E Chen, C. Su
{"title":"A methodology for fault model development for hierarchical linear systems","authors":"Yin-Chao Huang, Chung-Len Lee, Jun-Weir Lin, Jwu-E Chen, C. Su","doi":"10.1109/ATS.2000.893608","DOIUrl":null,"url":null,"abstract":"In this paper, a methodology to develop fault models for hierarchical linear systems which are composed of operational amplifiers (OP) is demonstrated and presented. The methodology at first presents a transfer function model for the open-loop OP based on analysis of element faults at the transistor level. Then it derives a transfer function model for the closed loop OP based on the derived open-loop OP level model, again a higher level fault model for a module which is composed of closed loop OPs. The models can handle ac faults. The benchmark state-variable filter is used as an example to demonstrate for this methodology. An application of the derived models to Monte Carlo simulation to save computation time is also demonstrated.","PeriodicalId":403864,"journal":{"name":"Proceedings of the Ninth Asian Test Symposium","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Ninth Asian Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2000.893608","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

In this paper, a methodology to develop fault models for hierarchical linear systems which are composed of operational amplifiers (OP) is demonstrated and presented. The methodology at first presents a transfer function model for the open-loop OP based on analysis of element faults at the transistor level. Then it derives a transfer function model for the closed loop OP based on the derived open-loop OP level model, again a higher level fault model for a module which is composed of closed loop OPs. The models can handle ac faults. The benchmark state-variable filter is used as an example to demonstrate for this methodology. An application of the derived models to Monte Carlo simulation to save computation time is also demonstrated.
层次线性系统的故障模型开发方法
本文提出了一种建立由运放组成的层次线性系统故障模型的方法。该方法首先提出了一个基于晶体管级元件故障分析的开环OP传递函数模型。然后在导出的开环OP级模型的基础上,推导出闭环OP的传递函数模型,再推导出由闭环OP组成的模块的高级故障模型。这些型号可以处理交流故障。以基准状态变量过滤器为例,对该方法进行了演示。本文还演示了将导出的模型应用于蒙特卡罗仿真以节省计算时间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信