Sensitivity-based reconstruction in microwave imaging using near-field calibration measurements

Sheng Tu, Yifan Zhang, J. McCombe, N. Nikolova
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Abstract

The sensitivity-based microwave imaging method requires the incident field distributions in the background medium, which insofar have been derived from analytical or simulation models. However, such models often prove inadequate in near-field imaging due to the complexity of the background and the acquisition setup. Here, we propose a calibration technique to efficiently acquire the necessary field information via measurements of a known calibration object containing a sufficiently small “point” scatterer. Only measurement data is needed to generate the images, i.e., the simulation or analytical incident-field model is replaced by a measurement-based model. The approach is validated through experiments with a planar raster scanning system. Two different tissue mimicking phantoms are imaged: i) dielectric cylinders embedded in a 5-cm thick layer of high-loss dielectric material and ii) tissue phantom containing porcine and bovine meat samples as well as grape inclusions.
基于近场校准测量的微波成像灵敏度重建
基于灵敏度的微波成像方法需要背景介质中的入射场分布,迄今为止,这些分布都是由分析或模拟模型推导出来的。然而,由于背景和采集设置的复杂性,这种模型在近场成像中往往被证明是不够的。在这里,我们提出了一种校准技术,通过测量包含足够小的“点”散射体的已知校准对象来有效地获取必要的场信息。生成图像只需要测量数据,即模拟或分析的入射场模型被基于测量的模型所取代。通过平面光栅扫描系统的实验验证了该方法的有效性。对两种不同的组织模拟幻影进行成像:i)介电圆柱体嵌入5厘米厚的高损耗介电材料层;ii)组织幻影包含猪肉和牛肉样本以及葡萄内含物。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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