Interconnection Capacitances Dependence On Further Neighbourhood In The Bus - Experimental Verification Of The Model

Proceedings of the International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006. Pub Date : 2006-06-22 DOI:10.1109/MIXDES.2006.1706626

A. Jarosz, A. Pfitzner

引用次数: 3

Abstract

An analytical model, taking into account the further neighbourhood influence on interconnection capacitances was proposed in our previous works (Jarosz, 2002). In this paper a method of experimental verification of those formulas and a test chip designed for the AMS 0.35mum technology are presented. Results of measurements and the correctness of the model are discussed

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母线中互连电容对邻域的依赖——模型的实验验证

在我们以前的工作中提出了一个分析模型，考虑到对互连电容的进一步邻里影响(Jarosz, 2002)。本文给出了这些公式的实验验证方法，并设计了一种针对AMS 0.35 mm工艺的测试芯片。对测量结果和模型的正确性进行了讨论

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Proceedings of the International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006.

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