N. Varachiu, J. Noullet, A. Rumeau, D. Dragomirescu
{"title":"Process Capability Evaluation for Fabrication of ASIC IR-UWB Transceivers","authors":"N. Varachiu, J. Noullet, A. Rumeau, D. Dragomirescu","doi":"10.1109/SMICND.2019.8923859","DOIUrl":null,"url":null,"abstract":"This paper presents process capability evaluation for a lot of five ASIC prototypes of an impulse radio ultra-wideband transceiver (IR-UWB), fabricated in the white room facility of LAAS Toulouse, France, in ST Microelectronics CMOS 65 nm technology. The main purpose of our undertaken is, starting from the Voice of the Customer (VoC) -offered by an outstanding industrial aeronautic consortium - to provide an evaluation of manufacturing process capability, at different confidence levels, as usually required in industry.","PeriodicalId":151985,"journal":{"name":"2019 International Semiconductor Conference (CAS)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 International Semiconductor Conference (CAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.2019.8923859","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
This paper presents process capability evaluation for a lot of five ASIC prototypes of an impulse radio ultra-wideband transceiver (IR-UWB), fabricated in the white room facility of LAAS Toulouse, France, in ST Microelectronics CMOS 65 nm technology. The main purpose of our undertaken is, starting from the Voice of the Customer (VoC) -offered by an outstanding industrial aeronautic consortium - to provide an evaluation of manufacturing process capability, at different confidence levels, as usually required in industry.