A drawback of converting to a low stress molding compound

C. Virojanapa, M. Hadkeaw, D. Kane
{"title":"A drawback of converting to a low stress molding compound","authors":"C. Virojanapa, M. Hadkeaw, D. Kane","doi":"10.1109/ECTC.1993.346779","DOIUrl":null,"url":null,"abstract":"This paper presents a failure mechanism resulting in interfacial cracks and broken wedge bonds that was occasionally encountered on some plastic DIPs with large leadframe paddle upon conversion to a lower stress molding compound. The root cause of the problem was a pull force during leads forming in excess of the strength of the center lead/wedge bond/molding compound structure. The paper-shows how acoustic microscopy and finite element analysis enabled the elimination of the problem via optimization of the packaging processes and redesign of some leadframes.<<ETX>>","PeriodicalId":281423,"journal":{"name":"Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1993.346779","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

This paper presents a failure mechanism resulting in interfacial cracks and broken wedge bonds that was occasionally encountered on some plastic DIPs with large leadframe paddle upon conversion to a lower stress molding compound. The root cause of the problem was a pull force during leads forming in excess of the strength of the center lead/wedge bond/molding compound structure. The paper-shows how acoustic microscopy and finite element analysis enabled the elimination of the problem via optimization of the packaging processes and redesign of some leadframes.<>
转换成低应力成型化合物的缺点
本文提出了一种失效机制,导致界面裂纹和楔形键断裂,偶尔会遇到一些塑料dip与大引线框架叶片转化为低应力成型化合物。问题的根本原因是引线成形过程中的拉力超过了中心引线/楔键/成型复合结构的强度。这篇论文展示了声学显微镜和有限元分析如何通过优化包装过程和重新设计一些引线框来消除问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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