0.15 /spl mu/m CMOS with high reliability and performance

Abstract

0.15 /spl mu/m CMOSFETs with high reliability and performance have been realized. The acceptable power supply voltage V/sub cc/ was estimated to be 1.9 V. A reasonably short ring oscillator delay of 33 ps was obtained for the 1.9 V V/sub cc/, maintaining an 0.4 V threshold voltage. Anomalous surface state generation and V/sub TH/ shift for the pMOS were observed, though the degradation was less severe than the nMOS.<>