{"title":"Statistical analysis on variation tolerance of time-shared Twin Memristor Crossbar for pattern matching","authors":"S. N. Truong, K. Pham, Wonsun Yang, K. Min","doi":"10.1109/ICSSE.2017.8030931","DOIUrl":null,"url":null,"abstract":"In this paper, we analyze the variation tolerance of time-shared Twin Memristor Crossbar (TMC) for various inter-correlation and intra-correlation parameters. Here the percentage variation in memristance is increased from 0% to 40%. The statistical analysis performed here indicates the original TMC and the time-shared TMC show almost the same tolerance to memristance variation when the variation of all memristors in one array are assumed random, referred to as intra-array correlation is zero. However, when the intra-array correlation becomes as high as 1, in other words, variations of all memristors in the same array are correlated each other, the time-shared TMC shows better recognition rate by 5% on average, compared to the original TMC. From the statistical simulation results, we can expect the time-shared TMC has better variation-tolerance than the original TMC, in pattern matching application.","PeriodicalId":296191,"journal":{"name":"2017 International Conference on System Science and Engineering (ICSSE)","volume":"86 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 International Conference on System Science and Engineering (ICSSE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSSE.2017.8030931","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this paper, we analyze the variation tolerance of time-shared Twin Memristor Crossbar (TMC) for various inter-correlation and intra-correlation parameters. Here the percentage variation in memristance is increased from 0% to 40%. The statistical analysis performed here indicates the original TMC and the time-shared TMC show almost the same tolerance to memristance variation when the variation of all memristors in one array are assumed random, referred to as intra-array correlation is zero. However, when the intra-array correlation becomes as high as 1, in other words, variations of all memristors in the same array are correlated each other, the time-shared TMC shows better recognition rate by 5% on average, compared to the original TMC. From the statistical simulation results, we can expect the time-shared TMC has better variation-tolerance than the original TMC, in pattern matching application.