Accuracy of Dielectric Material Characterization at Millimeter-wave

Abstract

This paper analyzes the accuracy of characterized dielectric constant by existing two-microstrip-line (L-L) method and a recently proposed hybrid-microstrip-line (hybrid-ML) method at millimeter-wave frequency. The analysis is made on two types of dielectric materials: Rogers RT/d5880 standard high-frequency substrate and plain-woven polyester fabric substrate. The result shows that the hybrid-ML can achieve a good agreement between characterzed and vendor-specified values with less error as compared to the L-L method. Besides, due to the introduced error boxes, the hybrid-ML method also shows less variance in characterized values for both materials over the frequency of interest.