An overview of the ATML family and related standards

Abstract

The “IEEE Full-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML” (IEEE Std 1671™-2010) and all its ‘dot’ standards have been published and are available from the IEEE. The ATML standards working group are currently revising these trial use ‘dot’ standards to match their current development eXtendable Markup Language (XML) schemas in line with the full use IEEE Std 1671. The “Common” ATML XML schemas are posted to an IEEE download site on the World Wide Web, available for download and use. In short, the ATML standard and it's ‘dot’ companions are now published, available, and their associated XML Schemas are downloadable from the Web, and in use across industry.