{"title":"A fault-tolerant sequential circuit design for soft errors based on fault-secure circuit","authors":"S. Ostanin, A. Matrosova, N. Butorina, V. Lavrov","doi":"10.1109/EWDTS.2016.7807676","DOIUrl":null,"url":null,"abstract":"This paper presents a fault-tolerant synchronous sequential circuit design based on fault-secure system with low overhead. The scheme has only one fault-secure sequential circuit, a normal (unprotected) sequential circuit, a checker and rather simple XOR circuit. It is proved the reliability properties of the suggested scheme not only for single stuck-at faults at gate poles but for path delay faults transient and intermittent. It is supposed that each next fault appears when a previous one has disappeared.","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE East-West Design & Test Symposium (EWDTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EWDTS.2016.7807676","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
This paper presents a fault-tolerant synchronous sequential circuit design based on fault-secure system with low overhead. The scheme has only one fault-secure sequential circuit, a normal (unprotected) sequential circuit, a checker and rather simple XOR circuit. It is proved the reliability properties of the suggested scheme not only for single stuck-at faults at gate poles but for path delay faults transient and intermittent. It is supposed that each next fault appears when a previous one has disappeared.