GH25-10: New qualified power GaN HEMT process from technology to product overview

D. Floriot, V. Brunel, M. Camiade, C. Chang, B. Lambert, Z. Ouarch-Provost, H. Blanck, J. Grunenputt, M. Hosch, H. Jung, J. Splettstober, U. Meiners
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引用次数: 31

Abstract

The performances and the results of the qualification plan of the new high power GaN HEMT process GH25-10 are summarized in this paper. This technology would be the first ¼ gate length process qualified in Europe on 4” SiC substrate and will be fully open in foundry mode mid of 2014. It addresses applications up to 20 GHz with state of the art figure of merits in term of power density, gain, efficiency and reliability. The first part is dedicated to the description of the process and the associated spread data analysis. A second part is focused on the review of the performances, the electrical domain of validity (operating ratings) and modeling capabilities. This view is completed by some results of the qualification process. Finally, the last part will be focused on the product development based on the GH25-10 GaN technology.
GH25-10:从技术到产品概述的新型合格功率GaN HEMT工艺
本文综述了大功率GaN HEMT新工艺GH25-10的性能和鉴定计划的结果。这项技术将是欧洲第一个在4”SiC衬底上合格的¼栅极长度工艺,并将于2014年中期在代工模式下完全开放。它适用于高达20 GHz的应用,在功率密度、增益、效率和可靠性方面具有最先进的优点。第一部分是对流程的描述和相关的传播数据分析。第二部分侧重于对性能、有效性的电域(操作评级)和建模能力的回顾。这一观点是通过一些结果的鉴定过程完成的。最后,重点介绍了基于GH25-10 GaN技术的产品开发。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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