Characterization of LTCC substrate up to 100 GHz

2008 International Conference on Microwave and Millimeter Wave Technology Pub Date : 2008-04-21 DOI:10.1109/ICMMT.2008.4540821

S. Adhikari, A. Stelzer, A. Springer, C. Wagner, C. Korden, M. Stadler

引用次数: 5

Abstract

This paper deals with the characterization of LTCC substrates up to 100 GHz. Planar transmission lines and resonators are used for characterizing the substrates. Measurement results for the relative permittivity obtained from the investigated structures are presented.

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高达100ghz的LTCC衬底特性

本文研究了高达100ghz的LTCC基板的特性。平面传输线和谐振器用于表征衬底。给出了所研究结构的相对介电常数的测量结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2008 International Conference on Microwave and Millimeter Wave Technology

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