Measuring radiation of small electronic equipment in three-dimensional TEM cells

M. Klingler, V. Deniau, S. Egot, B. Démoulin, T. Sarkar
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引用次数: 1

Abstract

Three-dimensional TEM cells are starting to be used for EMC immunity testing and radiation measurements. In the second case, these new test facilities offer the advantage of not having to place the equipment under test in different positions to obtain its total radiated power or its far-field radiation pattern. After a brief overview of the general concept of 3D-TEM cells followed by a summary on radiation measurements in TEM and GTEM cells, the second part of this paper presents the practical application of radiation measurements of off-the-shelf electronic equipment using an industrial prototype of a 6-plate 3D-TEM cell. The results are then compared to reference results obtained of a conventional symmetrical TEM cell. This paper concludes with the repeatability and reproducibility of results obtained and the possibilities of measuring radiation from very small items such as electronic components.
小型电子设备在三维透射电镜室中的辐射测量
三维瞬变电磁箱开始用于电磁兼容抗扰度测试和辐射测量。在第二种情况下,这些新的测试设施提供的优点是不必将被测设备放在不同的位置来获得其总辐射功率或远场辐射图。在简要概述了3D-TEM单元的一般概念之后,总结了TEM和GTEM单元中的辐射测量,本文的第二部分介绍了使用6板3D-TEM单元的工业原型对现成电子设备进行辐射测量的实际应用。然后将结果与常规对称TEM电池的参考结果进行比较。本文总结了所得结果的可重复性和再现性,以及从电子元件等非常小的物体测量辐射的可能性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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