The Impact of Hardware Folding on Dependability in Spaceborne FPGA-based Neural Networks

I. Souvatzoglou, D. Agiakatsikas, G. Antonopoulos, V. Vlagkoulis, Aitzan Sari, Athanasios Papadimitriou, M. Psarakis
{"title":"The Impact of Hardware Folding on Dependability in Spaceborne FPGA-based Neural Networks","authors":"I. Souvatzoglou, D. Agiakatsikas, G. Antonopoulos, V. Vlagkoulis, Aitzan Sari, Athanasios Papadimitriou, M. Psarakis","doi":"10.1109/ICFPT56656.2022.9974551","DOIUrl":null,"url":null,"abstract":"Commercial SRAM-based field-programmable gate arrays (FPGAs) are becoming popular computing platforms for building efficient Neural Network (NN) accelerators for space missions. FPGAs can implement custom NN architectures that are tailored to the requirements of the mission to improve the performance-to-watt ratio of the design. However, SRAM FPGAs are vulnerable to radiation-induced Single Event Upsets (SEUs), imposing significant design-for-reliability challenges. In this work, we study the impact of hardware folding on the dependability of Binarised NN (BNN) FPGA accelerators. Hard-ware folding configures the level of resource sharing in the design. We implemented three design versions of a BNN that performs image classification. The BNNs were generated with FINN, an open-source framework for developing quantised NNs on AMD-Xilinx FPGAs. The BNNs were implemented on a Zynq-7020 system-on-chip FPGA and tested with configuration memory fault injection experiments to estimate their SEU vulnerability. The three BNN design versions have a maximum (Max), medium (Med), and minimum (Min) folding factor, respectively. Assuming a Low Earth Orbit (LEO), our results show that the Med BNN has the highest Mean Time Between Failure (MTBF) and the Min has the lowest MTBF. However, Min has the highest Mean Executions Between Failure (MEBF) due to its high computational performance.","PeriodicalId":239314,"journal":{"name":"2022 International Conference on Field-Programmable Technology (ICFPT)","volume":"2020 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 International Conference on Field-Programmable Technology (ICFPT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICFPT56656.2022.9974551","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Commercial SRAM-based field-programmable gate arrays (FPGAs) are becoming popular computing platforms for building efficient Neural Network (NN) accelerators for space missions. FPGAs can implement custom NN architectures that are tailored to the requirements of the mission to improve the performance-to-watt ratio of the design. However, SRAM FPGAs are vulnerable to radiation-induced Single Event Upsets (SEUs), imposing significant design-for-reliability challenges. In this work, we study the impact of hardware folding on the dependability of Binarised NN (BNN) FPGA accelerators. Hard-ware folding configures the level of resource sharing in the design. We implemented three design versions of a BNN that performs image classification. The BNNs were generated with FINN, an open-source framework for developing quantised NNs on AMD-Xilinx FPGAs. The BNNs were implemented on a Zynq-7020 system-on-chip FPGA and tested with configuration memory fault injection experiments to estimate their SEU vulnerability. The three BNN design versions have a maximum (Max), medium (Med), and minimum (Min) folding factor, respectively. Assuming a Low Earth Orbit (LEO), our results show that the Med BNN has the highest Mean Time Between Failure (MTBF) and the Min has the lowest MTBF. However, Min has the highest Mean Executions Between Failure (MEBF) due to its high computational performance.
硬件折叠对星载fpga神经网络可靠性的影响
商用基于sram的现场可编程门阵列(fpga)正在成为构建用于空间任务的高效神经网络(NN)加速器的流行计算平台。fpga可以实现根据任务要求定制的神经网络架构,以提高设计的性能瓦特比。然而,SRAM fpga容易受到辐射引起的单事件干扰(seu)的影响,这给可靠性设计带来了重大挑战。在这项工作中,我们研究了硬件折叠对二值化神经网络(BNN) FPGA加速器可靠性的影响。硬件折叠配置设计中的资源共享级别。我们实现了执行图像分类的BNN的三个设计版本。bnn是由FINN生成的,FINN是一个用于在AMD-Xilinx fpga上开发量化nn的开源框架。在Zynq-7020片上系统FPGA上实现了bnn,并通过配置存储器故障注入实验对其进行了测试,以估计其SEU漏洞。三种BNN设计版本分别具有最大(Max),中等(Med)和最小(Min)折叠因子。在低地球轨道(LEO)条件下,我们的研究结果表明,中等轨道的平均故障间隔时间(MTBF)最高,中等轨道的平均故障间隔时间(MTBF)最低。然而,由于Min具有较高的计算性能,它具有最高的平均失败执行次数(MEBF)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信