{"title":"Estimation of capacitance of small junction from liquid He temperature measurement","authors":"A. Iwasa, A. Fukushima, A. Sato, Y. Sakamoto","doi":"10.1109/CPEM.1998.699874","DOIUrl":null,"url":null,"abstract":"We show the way to estimate capacitance C and tunnel resistance R/sub T/ of a small junction from 4.2 K measurements using high temperature expansion for I-V curve. It enables us prompt feedback to fabricate the single electron tunneling elements.","PeriodicalId":239228,"journal":{"name":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.1998.699874","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
We show the way to estimate capacitance C and tunnel resistance R/sub T/ of a small junction from 4.2 K measurements using high temperature expansion for I-V curve. It enables us prompt feedback to fabricate the single electron tunneling elements.