Modeling of Electromagnetic Fault Injection

Abstract

Electromagnetic Fault Injection (EMFI) has recently gained popularity as a mean to induce faults because of its inherent advantages. Despite this popularity, there is only little information on how EMFI generates faults. Within this context, this paper aims at filling this lack by proposing a complete modeling of EM induction on Integrated Circuit (IC). The introduced model is confronted to experimental data in order to demonstrate its robustness.