Hitomi Tanaka, Yuta Aiba, T. Maeda, Kensuke Ota, Y. Higashi, K. Sawa, F. Kikushima, Masayuki Miura, T. Sanuki
{"title":"Toward 7 Bits per Cell: Synergistic Improvement of 3D Flash Memory by Combination of Single-crystal Channel and Cryogenic Operation","authors":"Hitomi Tanaka, Yuta Aiba, T. Maeda, Kensuke Ota, Y. Higashi, K. Sawa, F. Kikushima, Masayuki Miura, T. Sanuki","doi":"10.1109/IMW52921.2022.9779301","DOIUrl":null,"url":null,"abstract":"In this paper, it is shown that the combination of single-crystal channel and cryogenic operation at 77 K using liquid nitrogen improves the cell transistor characteristics and the storage performance of 3D Flash memory. Compared to the cryogenic operation with poly-Si channels, that we have already reported, the cryogenic operation with single-crystal channels results in a steepening of the cell transistor subthreshold slope and reduced read noise. In particular, read noise is significantly suppressed to one-third due to the synergistic effect of the improvement by single-crystal and the cryogenic operation, compared with poly-Si channel in room temperature. Furthermore, data retention is improved at cryogenic temperature compared to room temperature. These improvements lead to a narrower Vth distribution of the cell, which enables bit-cost scaling through a multi-level cell. An ultra-multi-level cell of 7 bits per cell is successfully demonstrated for the first time, and its feasibleness in future storage products is shown.","PeriodicalId":132074,"journal":{"name":"2022 IEEE International Memory Workshop (IMW)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE International Memory Workshop (IMW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMW52921.2022.9779301","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this paper, it is shown that the combination of single-crystal channel and cryogenic operation at 77 K using liquid nitrogen improves the cell transistor characteristics and the storage performance of 3D Flash memory. Compared to the cryogenic operation with poly-Si channels, that we have already reported, the cryogenic operation with single-crystal channels results in a steepening of the cell transistor subthreshold slope and reduced read noise. In particular, read noise is significantly suppressed to one-third due to the synergistic effect of the improvement by single-crystal and the cryogenic operation, compared with poly-Si channel in room temperature. Furthermore, data retention is improved at cryogenic temperature compared to room temperature. These improvements lead to a narrower Vth distribution of the cell, which enables bit-cost scaling through a multi-level cell. An ultra-multi-level cell of 7 bits per cell is successfully demonstrated for the first time, and its feasibleness in future storage products is shown.