New insight into tantalum pentoxide Metal-Insulator-Metal (MIM) capacitors: Leakage current modeling, self-heating, reliability assessment and industrial applications

V. Martinez, C. Besset, F. Monsieur, D. Ney, L. Montès, G. Ghibaudo
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引用次数: 3

Abstract

In this study, conduction asymmetry is analyzed using asymmetric stacks in order to appreciate the cathode role. Then original test structures are used to highlight fringe leakage and to model asymmetry in a pure Ta2O5 capacitor for both surface and peripheral currents. Finally, the impact of peripheral on self-heating and consequently on reliability parameters is deeply investigated. Important information are then provided regarding intrinsic MIM characteristics, process optimization, reliability methodology and design rules.
五氧化二钽金属-绝缘体-金属(MIM)电容器的新见解:泄漏电流建模,自加热,可靠性评估和工业应用
在本研究中,为了了解阴极的作用,利用非对称堆叠分析了导电不对称性。然后使用原始测试结构来突出条纹泄漏并模拟纯Ta2O5电容器表面和外围电流的不对称性。最后,深入研究了外设对自热及可靠性参数的影响。然后提供了关于内在MIM特征、工艺优化、可靠性方法和设计规则的重要信息。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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