Application of localization factor for the detection of tin oxidation with AFM

Abstract

The aim of this paper is the demonstration of a novel parameter called localization factor for the detection and monitoring of tin surface oxidation through atomic force microscope (AFM) imaging. A previously polished and oxide free tin surface was oxidized in a controlled environment and the resulting surface topography was evaluated numerically with AFM. Results indicate that the obtained localization factor values correlate well with the structural changes of the surface, namely with the development of the oxide grains.