K. Chakraborty, Anurag P. Gupta, M. Bhattacharya, S. Kulkarni, P. Mazumder
{"title":"A physical design tool for built-in self-repairable static RAMs","authors":"K. Chakraborty, Anurag P. Gupta, M. Bhattacharya, S. Kulkarni, P. Mazumder","doi":"10.1145/307418.307594","DOIUrl":null,"url":null,"abstract":"A novel physical design tool, BISRAMGEN, that generates layout geometries of parametrized built-in self-repairable SRAM modules, producing significant improvement in testability, reliability, production yield and manufacturing cost of ASICs and microprocessors with embedded RAMs, is presented.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/307418.307594","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
A novel physical design tool, BISRAMGEN, that generates layout geometries of parametrized built-in self-repairable SRAM modules, producing significant improvement in testability, reliability, production yield and manufacturing cost of ASICs and microprocessors with embedded RAMs, is presented.