High performance ball grid array utilizing flip chip bonding on buildup printed circuit board

K. Yamanaka, H. Mori, Y. Tsukada
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引用次数: 4

Abstract

A flip chip bonding on a buildup Printed Circuit Board (PCB) has been emerging in a chip carrier area. As chip performance has been improving rapidly, it is now required to have a high performance chip carrier. This paper demonstrates a Ball Grid Array (BGA) application where a flip chip bonding on a multiple buildup layer PCB has an essential electrical performance for a high performance chip which has more than 1000 I/Os and more than 128 bit bus operating at 100 MHz. The effect of a ground plane and a power/ground pick up path design on crosstalk and ground bounce is discussed using SLC-BGA. Also discussed is a package electrical performance comparing various package types. We conclude that flip chip bonding on multiple buildup layer PCB technology is essential for a high performance chip carrier.
利用倒装芯片键合的高性能球栅阵列
在芯片载体领域出现了一种基于积层印刷电路板(PCB)的倒装芯片键合技术。随着芯片性能的飞速提高,对高性能芯片载体提出了更高的要求。本文演示了一个球栅阵列(BGA)应用,其中在多层累积层PCB上的倒装芯片键合对于具有超过1000个I/ o和超过128位总线工作在100 MHz的高性能芯片具有基本的电气性能。利用SLC-BGA讨论了接地平面和电源/地拾取路径设计对串扰和地弹跳的影响。还讨论了不同封装类型的封装电气性能的比较。我们得出结论,在多累积层PCB上的倒装芯片键合技术对于高性能芯片载体至关重要。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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