Scaling down a level shifter circuit in 28 nm FDSOI technology

Saikat Chatterjee, U. Rückert
{"title":"Scaling down a level shifter circuit in 28 nm FDSOI technology","authors":"Saikat Chatterjee, U. Rückert","doi":"10.1109/ULIS.2018.8354772","DOIUrl":null,"url":null,"abstract":"In this work, we used a Pareto front based scaling method to reproduce a level shifter circuit in 28nm FDSOI technology. We selected propagation delay, switching energy, static power dissipation and noise margin, to evaluate the circuit performance and optimize the scale down procedure. The final result showed a set of transistor dimensions, which ensured a desired performance of the level shifter circuit in 28nm fully depleted silicon-on-insulator (FDSOI) technology from ST Microelectronics. The circuit can operate correctly for supply voltages from 250 mV to 1V. The propagation delay of the level shifter is 3.11ns and the static power dissipation is 265 pW. The results contain the comparison of the transistor dimensions across different technologies.","PeriodicalId":383788,"journal":{"name":"2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ULIS.2018.8354772","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

In this work, we used a Pareto front based scaling method to reproduce a level shifter circuit in 28nm FDSOI technology. We selected propagation delay, switching energy, static power dissipation and noise margin, to evaluate the circuit performance and optimize the scale down procedure. The final result showed a set of transistor dimensions, which ensured a desired performance of the level shifter circuit in 28nm fully depleted silicon-on-insulator (FDSOI) technology from ST Microelectronics. The circuit can operate correctly for supply voltages from 250 mV to 1V. The propagation delay of the level shifter is 3.11ns and the static power dissipation is 265 pW. The results contain the comparison of the transistor dimensions across different technologies.
28纳米FDSOI技术中电平移位电路的缩小
在这项工作中,我们使用基于Pareto前的缩放方法在28nm FDSOI技术中重现电平移位电路。我们选择了传输延迟、开关能量、静态功耗和噪声裕度来评估电路的性能,并优化了缩小过程。最终结果显示了一组晶体管尺寸,确保了意法半导体28nm完全耗尽绝缘体上硅(FDSOI)技术的电平移位电路的理想性能。该电路可以在250 mV到1V的电压范围内正常工作。移电平器的传输延迟为3.11ns,静态功耗为265 pW。结果包含了不同技术晶体管尺寸的比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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