Advantage of CNTFET characteristics over MOSFET to reduce leakage power

S. K. Sinha, S. Chaudhury
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引用次数: 28

Abstract

In this paper we compare and justify the advantage of CNTFET devices over MOSFET devices in nanometer regime. Thereafter we have analyzed the effect of chiral vector, and temperature on threshold voltage of CNTFET device. After simulation on HSPICE tool we observed that the high threshold voltage can be achieved at low chiral vector pair. It is also observed that the effect of temperature on threshold voltage of CNTFET is negligibly small. After analysis of channel length variation and their impact on threshold voltage of CNTFET as well as MOSFET devices, we found an anomalous result that the threshold voltage increases with decreasing channel length in CNTFET devices, this is quite contrary to the well known short channel effect. It is observed that at below 10 nm channel length the threshold voltage is increased rapidly in case of CNTFET device whereas in case of MOSFET device the threshold voltage decreases drastically below 10 nm channel length.
CNTFET特性优于MOSFET,可降低泄漏功率
在本文中,我们比较并证明了cnfet器件在纳米范围内优于MOSFET器件的优点。分析了手性矢量和温度对CNTFET器件阈值电压的影响。通过在HSPICE工具上的仿真,我们发现在低手性向量对下可以实现高阈值电压。温度对CNTFET阈值电压的影响可以忽略不计。在分析了通道长度变化及其对CNTFET和MOSFET器件阈值电压的影响后,我们发现了一个异常的结果,即CNTFET器件的阈值电压随着通道长度的减小而增加,这与众所周知的短通道效应完全相反。观察到,在通道长度小于10 nm时,cnfet器件的阈值电压迅速增加,而对于MOSFET器件,阈值电压在通道长度小于10 nm时急剧下降。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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