Subthreshold Analog/RF performance estimation of doping-less DGFET for ULP applications

Anup Kumar, Chitrakant Sahu, Jawar Singh
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引用次数: 1

Abstract

In this paper, we report the potential of the doping-less (DL) double gate field effect transistor (DL-DGFET), for ultra low power (ULP) subthreshold logic applications. We demonstrated that the proposed DL-DGFET do not require any doping from source to drain region and it can perform significantly better than highly doped junctionless (JL) and abrupt S/D inversion-mode (IM) DGFETs. The DL-DGFET achieves 1.8X and 2.75X cutoff frequency (fT), 1.7X and 3X maximum frequency of oscillation (fMAX) along with 10.5 and 18.6 dB improvement in intrinsic voltage gain (AVO) in comparison to conventional JL and non-underlap FETs, respectively. Simulation results revealed that the DL-DGFET alleviates the inherent trade-off between gain and bandwidth of nanodevices by 6X improvement in gain frequency product (GFP) over highly doped JL-DGFET due to significant reduction in parasitic capacitances.
用于ULP应用的无掺杂DGFET的亚阈值模拟/射频性能估计
在本文中,我们报告了无掺杂(DL)双栅场效应晶体管(DL- dgfet)在超低功耗(ULP)亚阈值逻辑应用中的潜力。我们证明了所提出的DL-DGFET不需要从源极到漏极的任何掺杂,并且它的性能明显优于高掺杂的无结(JL)和突然S/D反转模式(IM) dgfet。DL-DGFET的截止频率(fT)分别为1.8倍和2.75倍,最大振荡频率(fMAX)分别为1.7倍和3倍,固有电压增益(AVO)分别比传统的JL和非underlap fet提高10.5和18.6 dB。仿真结果表明,由于寄生电容的显著降低,DL-DGFET的增益频率积(GFP)比高掺杂的JL-DGFET提高了6倍,从而缓解了纳米器件在增益和带宽之间的固有权衡。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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