M. S. Kayastha, Ikuo Matsunami, D. Sapkota, M. Takahashi, K. Wakita
{"title":"Low driving voltage spatial light modulator fabricated by ultrahigh-purity GaAs","authors":"M. S. Kayastha, Ikuo Matsunami, D. Sapkota, M. Takahashi, K. Wakita","doi":"10.1109/ICIPRM.2010.5516076","DOIUrl":null,"url":null,"abstract":"Highly efficient surface normal spatial light modulators (SLMs) using ultrahigh purity GaAs layers (30 μm thick) grown on (100) — oriented n<sup>+</sup> — GaAs substrate by liquid phase epitaxy (LPE) method have been realized. The extinction ratio of 25 dB has been demonstrated with a low — driving voltage (32 V) at 895 nm, based on electroabsorption (EA) effect. Very large depletion length over 150 μm is confirmed by analyzing the extinction ratio and capacitance- voltage (C-V) measurements. The calculated value of impurity concentration is low (≈10<sup>12</sup> cm<sup>−3</sup>) and indicates donor and accepter in the device are highly compensated.","PeriodicalId":197102,"journal":{"name":"2010 22nd International Conference on Indium Phosphide and Related Materials (IPRM)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-07-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 22nd International Conference on Indium Phosphide and Related Materials (IPRM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIPRM.2010.5516076","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Highly efficient surface normal spatial light modulators (SLMs) using ultrahigh purity GaAs layers (30 μm thick) grown on (100) — oriented n+ — GaAs substrate by liquid phase epitaxy (LPE) method have been realized. The extinction ratio of 25 dB has been demonstrated with a low — driving voltage (32 V) at 895 nm, based on electroabsorption (EA) effect. Very large depletion length over 150 μm is confirmed by analyzing the extinction ratio and capacitance- voltage (C-V) measurements. The calculated value of impurity concentration is low (≈1012 cm−3) and indicates donor and accepter in the device are highly compensated.