Electrical Properties of CdFeSe, CdMnTe Epitaxial Films

Mehrabova M. A., Hasanov N. H., Guluzade V. G., Sadigov R. M.
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Abstract

Optimal conditions of obtaining perfect Cd1–xFexSe (x<0.08) and Cd1-xMnxTe (x=0.15) epitaxial films are defined. The electrical properties of Cd1–xFexSe (x<0.08) and Cd1-xMnxTe (x=0.15) epitaxial films have been studied at room temperature. It was defined that Cd1–xFexSe semimagnetic semiconductor epitaxial films are of n-type and Cd1-xMnxTe p-type. Electrical resistivity was defined 14.4 ·107 Ohm⋅cm. The effect of γ-irradiation on VAC of Cd1-xMnxTe epitaxial films is studied at doses Dγ ≤ 1.5 кGy.
CdFeSe、CdMnTe外延薄膜的电学性质
确定了获得理想的Cd1-xFexSe (x<0.08)和Cd1-xMnxTe (x=0.15)外延薄膜的最佳条件。研究了Cd1-xFexSe (x<0.08)和Cd1-xMnxTe (x=0.15)外延薄膜在室温下的电学性能。定义了Cd1-xFexSe半磁半导体外延膜为n型和Cd1-xMnxTe为p型。电阻率定义为14.4·107欧姆·厘米。研究了γ辐照剂量d≤1.5 кGy对Cd1-xMnxTe外延膜VAC的影响。
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