JSCAN: A joint-scan DFT architecture to minimize test time, pattern volume, and power

Jaynarayan T. Tudu
{"title":"JSCAN: A joint-scan DFT architecture to minimize test time, pattern volume, and power","authors":"Jaynarayan T. Tudu","doi":"10.1109/ISVDAT.2016.8064866","DOIUrl":null,"url":null,"abstract":"Traditionally, serial scan architecture have been predominantly used as a DFT technique for most of the designs. However, shrinking technology and increasing design complexity has brought a set of new test challenges. It initiates new research direction to explore innovative DFT architecture. This paper proposes a new DFT architecture, named as Joint-scan. The proposed architecture provides a solution for the test time, test data volume, and test power problems simultaneously. The primary idea here is to bring in the key advantages of serial scan and random access scan in a single architecture. The effectiveness of the proposed architecture has been demonstrated through experimental results by comparing with the state-of-the-art random access scan, and multiple sequential scan architecture. The results show promising reduction in test time, data volume, and test power.","PeriodicalId":301815,"journal":{"name":"2016 20th International Symposium on VLSI Design and Test (VDAT)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 20th International Symposium on VLSI Design and Test (VDAT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISVDAT.2016.8064866","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

Traditionally, serial scan architecture have been predominantly used as a DFT technique for most of the designs. However, shrinking technology and increasing design complexity has brought a set of new test challenges. It initiates new research direction to explore innovative DFT architecture. This paper proposes a new DFT architecture, named as Joint-scan. The proposed architecture provides a solution for the test time, test data volume, and test power problems simultaneously. The primary idea here is to bring in the key advantages of serial scan and random access scan in a single architecture. The effectiveness of the proposed architecture has been demonstrated through experimental results by comparing with the state-of-the-art random access scan, and multiple sequential scan architecture. The results show promising reduction in test time, data volume, and test power.
JSCAN:一种联合扫描DFT架构,可以最大限度地减少测试时间、模式体积和功耗
传统上,串行扫描体系结构主要用于大多数设计的DFT技术。然而,技术的萎缩和设计复杂性的增加带来了一系列新的测试挑战。为探索创新的DFT架构开辟了新的研究方向。本文提出了一种新的DFT结构,称为联合扫描。该体系结构同时解决了测试时间、测试数据量和测试功耗的问题。这里的主要思想是在单一架构中引入串行扫描和随机访问扫描的主要优点。通过与最先进的随机存取扫描和多次顺序扫描结构的比较,实验结果证明了该结构的有效性。结果表明,在测试时间,数据量和测试功率方面有希望减少。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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