M. Tomita, Honghai Jiang, Tamotsu Yamamoto, Yoshihiro Hayashi
{"title":"An algorithm for locating logic design errors","authors":"M. Tomita, Honghai Jiang, Tamotsu Yamamoto, Yoshihiro Hayashi","doi":"10.1109/ICCAD.1990.129955","DOIUrl":null,"url":null,"abstract":"Discusses the problem of locating logic design errors, and proposes an algorithm to solve it. Based on the results of logic verification, the authors introduce an input pattern for locating design errors. The pattern contains only one Boolean variable X/X and is used to sensitize the design errors. An algorithm for locating single design errors with the input patterns has been developed. Experimental results have shown the effectiveness of the input patterns and the algorithm for locating single design errors.<<ETX>>","PeriodicalId":242666,"journal":{"name":"1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers","volume":"109 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"51","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCAD.1990.129955","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 51
Abstract
Discusses the problem of locating logic design errors, and proposes an algorithm to solve it. Based on the results of logic verification, the authors introduce an input pattern for locating design errors. The pattern contains only one Boolean variable X/X and is used to sensitize the design errors. An algorithm for locating single design errors with the input patterns has been developed. Experimental results have shown the effectiveness of the input patterns and the algorithm for locating single design errors.<>