Enhanced thermal measurements of high power LEDs by junction characteristic

Chenning Ge, Shiwei Feng, Guangchen Zhang, Kaikai Ding, Peifeng Hu, H. Deng
{"title":"Enhanced thermal measurements of high power LEDs by junction characteristic","authors":"Chenning Ge, Shiwei Feng, Guangchen Zhang, Kaikai Ding, Peifeng Hu, H. Deng","doi":"10.1109/IWJT.2010.5474904","DOIUrl":null,"url":null,"abstract":"The measurements of junction temperature rise and thermal resistance of power LEDs by junction characteristic are proposed in this paper. The measured thermal resistance is corrected by the light-absorbing method. It is also proved that the physical meaning of the electrical average temperature rise of series LED array system is the arithmetic mean of the temperature rise of all sub-LEDs in the system. Therefore, a novel method to extract the temperature distribution of series LED systems is presented.","PeriodicalId":205070,"journal":{"name":"2010 International Workshop on Junction Technology Extended Abstracts","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 International Workshop on Junction Technology Extended Abstracts","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IWJT.2010.5474904","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

The measurements of junction temperature rise and thermal resistance of power LEDs by junction characteristic are proposed in this paper. The measured thermal resistance is corrected by the light-absorbing method. It is also proved that the physical meaning of the electrical average temperature rise of series LED array system is the arithmetic mean of the temperature rise of all sub-LEDs in the system. Therefore, a novel method to extract the temperature distribution of series LED systems is presented.
通过结特性增强大功率led的热测量
提出了利用结特性测量大功率led结温升和热阻的方法。用吸光法对测得的热阻进行校正。并证明了串联LED阵列系统的电气平均温升的物理含义是系统中所有子LED温升的算术平均值。为此,提出了一种提取串联LED系统温度分布的新方法。
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