Radiation testing results of COTS based space microcircuits

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference Pub Date : 1997-07-24 DOI:10.1109/REDW.1997.629792

P. Layton, D. Strobel, H. Anthony, R. Boss, J. Marshall, J. Parkinson, J. Spratt, B. Passenheim

引用次数: 8

Abstract

We present both heavy ion single event effect (SEE) and total ionizing dose (TID) data collected at Space Electronics Inc. for candidate spacecraft microelectronics.

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基于COTS的空间微电路辐射测试结果

我们提供了在空间电子公司收集的用于候选航天器微电子的重离子单事件效应(SEE)和总电离剂量(TID)数据。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference

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