{"title":"Field screening by amorphous carbon thin films","authors":"J. Xanthakis, R. Forbes","doi":"10.1109/IVNC.2005.1619508","DOIUrl":null,"url":null,"abstract":"We argue that the granularity of the screening charge distribution at or in the film surface may dominate the physics of field penetration into hopping conductors (including a-c:H films) and that a re-think of all related modelling looks necessary.","PeriodicalId":121164,"journal":{"name":"2005 International Vacuum Nanoelectronics Conference","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 International Vacuum Nanoelectronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVNC.2005.1619508","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We argue that the granularity of the screening charge distribution at or in the film surface may dominate the physics of field penetration into hopping conductors (including a-c:H films) and that a re-think of all related modelling looks necessary.