ADVANCED MIXED SIGNAL TESTING BY DSP LOCALIZED TESTER

Abstract

Koji Karube, Yoshiyuki Bessho, Tokuo Takakura, and Keita Gunji Yokogawa Hewlett-Packard 9-1, Takakura-cho, Hachioji, Tokyo JAPAN 192 W? developed a new arclzitechire tester iit which each resource has a local real-time digital signal processor (DSP) that enables the tester to peifonn wious applications. Previous&, this was difficult to do becaiue it required a yea t deal of nienioiy. Die tester calif also p e ~ o n i z real-tiine data processiiig, tlziis eliiiiiiiatiig the specialized hardware that is required for complicated nttixed-sigrzal device tests. Dzis paper not on@ show tlze liijuitatioizs related to previous arclzitectures, but also shows how ta use the tester to yerfoini ISDN tests mid the izewly developed ADC test.